Laboratory
Soutenance de thèse : Francesco PEDROLI le 12/03/2020
« Dielectric strength and leakage current: from synthesis to
processing optimization »
12/03/2020 - 14h00 - Amphithéâtre Clémence Royer - Bâtiment Jacqueline Ferrand de l’INSA Lyon
Doctorant : Francesco PEDROLI
Laboratoire INSA : LGEF
Thèse CIFRE : Sté Solvay
Ecole doctorale : ED 162 MEGA
Electro-active polymers (EAPs) such as P(VDF-TrFE-CTFE) was demonstrated to be greatly promising in the field of flexible sensors and actuators. The advantages of using EAPs for smart electrical devices are due to their low cost, elastic properties, low density and ability to be manufactured into various shapes and thicknesses. In earlier years, P(VDF-TrFE-CTFE) terpolymer attracted many researchers due to its relaxor-ferroelectric
property that exhibits high electrostriction phenomena. Although their attractiveness, this class of materials still owns two main technological limitations: low breakdown voltage and the high level of leakage current when high voltages are applied. The quadratic dependence of the strain response and mechanical energy density on the applied electric field highlights the relevance of EAP breakdown electric field, while reducing the dielectric losses. The low dielectric strength of P(VDF-TrFE-CTFE) terpolymer turns out to be a main concern for achieving high actuation performances. Moreover, the large of electric field required to attain satisfactory levels of deformation (≥ 40 V/µm, about) inevitably lead to high level of leakage current and thus short life-time. This work demonstrates that it is possible to dramatically increase the electrical breakdown and decrease the dielectric losses by controlling processing parameters of the polymer synthesis and fabrication procedures. Enhancement of intrinsic dielectric strength is obtained by tuning the terpolymer molecular weight and by improving the purity of polymeric dissolution used for fabrication of terpolymer films. The reduction of dielectric losses, and with particular attention at the high-voltage conduction losses (or leakage current) are achieved by the introduction of a novel thermal treatment in the film fabrication process, called electro-thermal annealing.